Invention Grant
- Patent Title: Temperature detecting circuit and temperature detecting apparatus using the same
- Patent Title (中): 温度检测电路及使用其的温度检测装置
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Application No.: US14585355Application Date: 2014-12-30
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Publication No.: US09523613B2Publication Date: 2016-12-20
- Inventor: Hirotaka Takihara , Shintaro Takahashi
- Applicant: Rohm Co., Ltd.
- Applicant Address: JP Kyoto
- Assignee: Rohm Co., Ltd.
- Current Assignee: Rohm Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Fish & Richardson P.C.
- Priority: JP2011-81795 20110401; JP2011-82673 20110404; JP2011-82674 20110404; JP2012-52530 20120309
- Main IPC: G01K13/00
- IPC: G01K13/00 ; H05K7/20 ; G01K7/00 ; H02M1/32 ; G01K1/02 ; H02M7/5387 ; H03K17/08
Abstract:
A temperature detecting apparatus includes a temperature detecting circuit configured to output a first pulse signal according to a temperature detected by a temperature sensor, and an insulating transformer configured to transmit the first pulse signal to an integrated circuit which is operated by an operation voltage different from that of the temperature detecting circuit. The insulating transformer is installed between the temperature detecting circuit and the integrated circuit. The temperature detecting circuit and the insulating transformer are mounted on a common substrate.
Public/Granted literature
- US20150117492A1 TEMPERATURE DETECTING CIRCUIT AND TEMPERATURE DETECTING APPARATUS USING THE SAME Public/Granted day:2015-04-30
Information query
