Invention Grant
- Patent Title: Method and system for gas temperature measurement
- Patent Title (中): 气体温度测量方法和系统
-
Application No.: US13969186Application Date: 2013-08-16
-
Publication No.: US09528880B2Publication Date: 2016-12-27
- Inventor: Guanghua Wang , Nirm Velumylum Nirmalan , Ronald Scott Bunker , Todd Garrett Wetzel , Robert Michael Zacharias , Shawn David Wehe , Robert David Briggs
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent John P. Darling
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01K1/14 ; G01K13/00 ; G01K3/00 ; G01J5/10 ; G01M15/14 ; G01J5/08 ; G01J5/60

Abstract:
A temperature measurement system includes a plurality of filaments. The plurality of filaments are configured to emit thermal radiation in a relatively broad and substantially continuous wavelength band at least partially representative of a temperature of the plurality of filaments. A first and second portion of the filaments has a differing first and a second diameter and/or emissivity, respectively. The system also includes a detector array configured to generate electrical signals at least partially representative of the thermal radiation received from the filaments. The system further includes a controller communicatively coupled to the detector array configured to transform the first electrical signals to a first temperature indication at least partially as a function of the first diameter and/or first emissivity and transform the second electrical signals to a second temperature indication at least partially as a function of the second diameter and/or emissivity.
Public/Granted literature
- US20150049786A1 METHOD AND SYSTEM FOR GAS TEMPERATURE MEASUREMENT Public/Granted day:2015-02-19
Information query