Invention Grant
- Patent Title: Integrated analysis devices and related fabrication methods and analysis techniques
- Patent Title (中): 综合分析装置及相关制造方法和分析技术
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Application No.: US12996410Application Date: 2009-06-05
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Publication No.: US09533879B2Publication Date: 2017-01-03
- Inventor: Han Cao , Michael D. Austin , Parikshit A. Deshpande , Mark Kunkel , Alexey Y. Sharonov , Michael Kochersperger
- Applicant: Han Cao , Michael D. Austin , Parikshit A. Deshpande , Mark Kunkel , Alexey Y. Sharonov , Michael Kochersperger
- Applicant Address: US PA Philadelphia
- Assignee: BioNano Genomics, Inc.
- Current Assignee: BioNano Genomics, Inc.
- Current Assignee Address: US PA Philadelphia
- Agency: Knobbe, Martens, Olson & Bear, LLP
- International Application: PCT/US2009/046427 WO 20090605
- International Announcement: WO2009/149362 WO 20091210
- Main IPC: G01N21/64
- IPC: G01N21/64 ; B81C1/00 ; B01L3/00 ; G01N21/03
Abstract:
Provided are integrated analysis devices having features of macroscale and nanoscale dimensions, and devices that have reduced background signals and that reduce quenching of fluorophores disposed within the devices. Related methods of manufacturing these devices and of using these devices are also provided.
Public/Granted literature
- US20110296903A1 INTEGRATED ANALYSIS DEVICES AND RELATED FABRICATION METHODS AND ANALYSIS TECHNIQUES Public/Granted day:2011-12-08
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