A circuit according to an example includes a digital-to-time converter and a signal processing circuit coupled to the digital-to-time converter and configured to generate a processed signal derived from a signal provided to the signal processing circuit, the processed signal including a predetermined phase relation with respect to the signal provided to the signal processing circuit, wherein the circuit is configured to receive a reference signal and to generate an output signal based on the received reference signal. The a measurement circuit is configured to measure a delay between the output signal and the reference signal, wherein the output of the digital-to-time converter is coupled to a memory configured to store calibration data of the digital-to-time converter based on the measured delay.