Invention Grant
US09552164B2 Apparatus, method and system for determining reference voltages for a memory
有权
用于确定存储器的参考电压的装置,方法和系统
- Patent Title: Apparatus, method and system for determining reference voltages for a memory
- Patent Title (中): 用于确定存储器的参考电压的装置,方法和系统
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Application No.: US14440066Application Date: 2013-11-22
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Publication No.: US09552164B2Publication Date: 2017-01-24
- Inventor: James A. McCall , Kuljit S. Bains
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- International Application: PCT/US2013/071532 WO 20131122
- International Announcement: WO2014/085266 WO 20140605
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G06F3/06 ; G11C7/10 ; G11C5/14 ; G11C29/02

Abstract:
Techniques and mechanisms for a memory device to concurrently receive and process signals each based on a different respective reference voltage level. In an embodiment, an input/output (I/O) interface of a memory device includes receiver circuits each to process a respective signal received via a corresponding signal line of a bus. In response to one or more configuration commands, a first receiver circuit is configured to process a first signal based on a first reference voltage level and a second receiver circuit is configured to process a second signal based on a second reference voltage level. In another embodiment, a memory controller sends the one or more configuration commands to such a memory device based on an evaluation of voltage swing characteristics each corresponding to a different respective signal line of a bus.
Public/Granted literature
- US20150309726A1 APPARATUS, METHOD AND SYSTEM FOR DETERMINING REFERENCE VOLTAGES FOR A MEMORY Public/Granted day:2015-10-29
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