Invention Grant
US09552210B2 Volatile memory device and methods of operating and testing volatile memory device
有权
易失性存储器件以及操作和测试易失性存储器件的方法
- Patent Title: Volatile memory device and methods of operating and testing volatile memory device
- Patent Title (中): 易失性存储器件以及操作和测试易失性存储器件的方法
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Application No.: US14101374Application Date: 2013-12-10
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Publication No.: US09552210B2Publication Date: 2017-01-24
- Inventor: Mi-Young Woo , Kwan-Yong Jin , Seock-Chan Hong
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2013-0012647 20130205
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G11C7/20 ; G11C29/36 ; G11C11/40 ; G11C29/04

Abstract:
A method is provided for operating a volatile memory device. The method includes performing a first initialization operation for the volatile memory device based on a boot code received from an external memory controller, storing the boot code in an internal register, reading the boot code stored in the internal register based on a first signal received from the external memory controller when the first initialization operation is not normally performed, and performing a second initialization operation for the volatile memory device based on the boot code read from the internal register.
Public/Granted literature
- US20140223245A1 VOLATILE MEMORY DEVICE AND METHODS OF OPERATING AND TESTING VOLATILE MEMORY DEVICE Public/Granted day:2014-08-07
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