Invention Grant
- Patent Title: Resistive memory device and operating method
- Patent Title (中): 电阻式存储器件及操作方法
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Application No.: US15166679Application Date: 2016-05-27
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Publication No.: US09552878B2Publication Date: 2017-01-24
- Inventor: Chi-Weon Yoon , Hyun-Kook Park , Dae-Seok Byeon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0148455 20141029
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/04 ; G11C13/00

Abstract:
A method of operating a memory device includes; applying a pre-write voltage to a selected memory cell by applying a first voltage to a first signal line connected to the selected memory cell and a second voltage to a second signal line connected to the selected memory cell during a first set writing interval, wherein a level of the first voltage is higher than a level of the second voltage, and thereafter, applying a write voltage to the selected memory cell by applying a third voltage having a level lower than the level of the first voltage and higher than the level of the second voltage to the first signal line during a second set writing interval.
Public/Granted literature
- US20160276030A1 RESISTIVE MEMORY DEVICE AND OPERATING METHOD Public/Granted day:2016-09-22
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