Invention Grant
- Patent Title: Sample analyzing device and sample analyzing method
- Patent Title (中): 样品分析装置和样品分析方法
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Application No.: US13702175Application Date: 2011-06-07
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Publication No.: US09557326B2Publication Date: 2017-01-31
- Inventor: Toru Inaba , Shinya Matsuoka , Taku Sakazume , Yoshihiro Yamashita , Masafumi Shimada , Osamu Kogi , Yushi Harada
- Applicant: Toru Inaba , Shinya Matsuoka , Taku Sakazume , Yoshihiro Yamashita , Masafumi Shimada , Osamu Kogi , Yushi Harada
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2010-131579 20100609; JP2011-073876 20110330; JP2011-123910 20110602
- International Application: PCT/JP2011/063046 WO 20110607
- International Announcement: WO2011/155489 WO 20111215
- Main IPC: G01N33/543
- IPC: G01N33/543 ; G01N33/53 ; B03C1/033 ; B03C1/28 ; B03C1/01 ; G01N33/574 ; G01N35/00

Abstract:
This invention provides a sample analyzing device and sample analyzing method designed to suppress nonuniform capture of magnetic particles (10) and detect a desired substance with higher accuracy. The sample analyzing device includes a flow channel (15) that conducts thereinto a sample which contains the magnetic particles (10), and magnetic field generating means (12) that generates magnetic fields for capturing the magnetic particles (10) in a magnetic particles capturing region of the flow channel (15); wherein the flow channel has at least one of structural characteristics that a cross-sectional area of the flow channel, at a downstream end of the magnetic particles capturing region, is larger than a cross-sectional area of the flow channel, at an upstream end of the magnetic particles capturing region, and that the magnetic fields generated by the magnetic field generating means (12) have a greater magnitude at a downstream side of the magnetic particles capturing region than at an upstream side thereof.
Public/Granted literature
- US20130143234A1 SAMPLE ANALYZING DEVICE AND SAMPLE ANALYZING METHOD Public/Granted day:2013-06-06
Information query
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