Invention Grant
- Patent Title: Apparatuses, systems, and methods for ion traps
- Patent Title (中): 离子阱的设备,系统和方法
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Application No.: US14700312Application Date: 2015-04-30
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Publication No.: US09558908B2Publication Date: 2017-01-31
- Inventor: Daniel Youngner
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morris Plains
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: B01D59/44
- IPC: B01D59/44 ; H01J3/38 ; H01J9/14

Abstract:
Apparatuses, systems, and methods for ion traps are described herein. One apparatus includes a number of microwave (MW) rails and a number of radio frequency (RF) rails formed with substantially parallel longitudinal axes and with substantially coplanar upper surfaces. The apparatus includes two sequences of direct current (DC) electrodes with each sequence formed to extend substantially parallel to the substantially parallel longitudinal axes of the MW rails and the RF rails. The apparatus further includes a number of through-silicon vias (TSVs) formed through a substrate of the ion trap and a trench capacitor formed in the substrate around at least one TSV.
Public/Granted literature
- US20160322188A1 APPARATUSES, SYSTEMS, AND METHODS FOR ION TRAPS Public/Granted day:2016-11-03
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