Invention Grant
US09568544B2 Testing fuse configurations in semiconductor devices 有权
测试半导体器件中的保险丝配置

Testing fuse configurations in semiconductor devices
Abstract:
A system includes a first integrated circuit configured to operate in at least a normal mode and a test mode and a second integrated circuit, where both the first integrated circuit and the second integrated circuit are disposed within a same semiconductor device package. The system further includes a first terminal, external to the semiconductor device package, electronically coupled to the first integrated circuit and the second integrated circuit. The first terminal is electronically coupled to a buffer in the second integrated circuit and used to convey signals to or from the first integrated circuit.
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