发明授权
US09577040B2 FinFET conformal junction and high epi surface dopant concentration method and device
有权
FinFET保形结和高epi表面掺杂剂浓度法和器件
- 专利标题: FinFET conformal junction and high epi surface dopant concentration method and device
- 专利标题(中): FinFET保形结和高epi表面掺杂剂浓度法和器件
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申请号: US15189079申请日: 2016-06-22
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公开(公告)号: US09577040B2公开(公告)日: 2017-02-21
- 发明人: Peijie Feng , Jianwei Peng , Yanxiang Liu , Shesh Mani Pandey , Francis Benistant
- 申请人: GLOBALFOUNDRIES Inc.
- 申请人地址: KY Grand Cayman
- 专利权人: GLOBALFOUNDRIES INC.
- 当前专利权人: GLOBALFOUNDRIES INC.
- 当前专利权人地址: KY Grand Cayman
- 代理机构: Ditthavong & Steiner, P.C.
- 主分类号: H01L29/78
- IPC分类号: H01L29/78 ; H01L29/08 ; H01L29/66 ; H01L21/265 ; H01L21/8234 ; H01L21/268 ; H01L29/10 ; H01L29/161 ; H01L29/167 ; H01L29/417 ; H01L21/324 ; H01L29/165
摘要:
A method of forming a source/drain region with an abrupt, vertical and conformal junction and the resulting device are disclosed. Embodiments include forming a gate electrode over and perpendicular to a semiconductor fin; forming first spacers on opposite sides of the gate electrode; forming second spacers on opposite sides of the fin; forming a cavity in the fin adjacent the first spacers, between the second spacers; partially epitaxially growing source/drain regions in each cavity; implanting a first dopant into the partially grown source/drain regions with an optional RTA thereafter; epitaxially growing a remainder of the source/drain regions in the cavities, in situ doped with a second dopant; and implanting a third dopant in the source/drain regions.
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