Invention Grant
US09583197B2 Nonvolatile memory device, program method thereof, and storage device including the same
有权
非易失性存储器件,其程序方法和包括该非易失性存储器件的存储器件
- Patent Title: Nonvolatile memory device, program method thereof, and storage device including the same
- Patent Title (中): 非易失性存储器件,其程序方法和包括该非易失性存储器件的存储器件
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Application No.: US15067751Application Date: 2016-03-11
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Publication No.: US09583197B2Publication Date: 2017-02-28
- Inventor: Ji-Sang Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeongg-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeongg-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2015-0044344 20150330
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/10 ; G11C16/24 ; G11C16/34 ; G11C11/56

Abstract:
A nonvolatile memory device includes memory cells stacked in a direction perpendicular to a substrate and further includes a first memory cell string connected between a selected bit line and a selected string selection line, a second memory cell string connected between the selected bit line and an unselected string selection line, and a third memory cell string connected to an unselected bit line. During a bit line setup section of a program operation, a ground voltage is provided to the selected bit line and a power supply voltage provided to the unselected string selection line is changed to the ground voltage.
Public/Granted literature
- US20160293258A1 NONVOLATILE MEMORY DEVICE, PROGRAM METHOD THEREOF, AND STORAGE DEVICE INCLUDING THE SAME Public/Granted day:2016-10-06
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