Invention Grant
US09589647B1 Semiconductor device with improved programming reliability 有权
具有提高编程可靠性的半导体器件

Semiconductor device with improved programming reliability
Abstract:
A semiconductor memory device includes a memory string including a first cells portion and a second cells portion each including a multiple of memory cells, the second cells portion being disposed over the first cells portion, and a control logic configured to control a peripheral circuit such that each of at least two memory cells in a top of the first cells portion and each of at least two memory cells in a bottom of the second cells portion is programmed to have a smaller data bit than remaining memory cells in the first and second cells portions.
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