Invention Grant
- Patent Title: Semiconductor device with improved programming reliability
- Patent Title (中): 具有提高编程可靠性的半导体器件
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Application No.: US15055885Application Date: 2016-02-29
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Publication No.: US09589647B1Publication Date: 2017-03-07
- Inventor: Jung Ryul Ahn , Ji Hyun Seo , Sung Yong Chung
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: William Park & Associates Ltd.
- Priority: KR10-2015-0140604 20151006
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/10 ; G11C11/56 ; H01L27/115

Abstract:
A semiconductor memory device includes a memory string including a first cells portion and a second cells portion each including a multiple of memory cells, the second cells portion being disposed over the first cells portion, and a control logic configured to control a peripheral circuit such that each of at least two memory cells in a top of the first cells portion and each of at least two memory cells in a bottom of the second cells portion is programmed to have a smaller data bit than remaining memory cells in the first and second cells portions.
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