Invention Grant
- Patent Title: Fast soft data by detecting leakage current and sensing time
- Patent Title (中): 通过检测泄漏电流和感测时间来实现快速的软数据
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Application No.: US14874257Application Date: 2015-10-02
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Publication No.: US09589655B1Publication Date: 2017-03-07
- Inventor: Young Pil Kim , Antoine Khoueir , Namoh Hwang
- Applicant: SEAGATE TECHNOLOGY LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Holland & Hart LLP
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/26 ; G11C16/32 ; G11C16/34 ; G11C11/56 ; G11C29/00

Abstract:
Systems and methods for low latency acquisition of soft data from a memory cell based on a sensing time and/or a leakage current are described. In one embodiment, the systems and methods may include applying a first read voltage to a word line of a page of memory cells selected by a processor of a flash memory device for a read operation, applying a pass voltage to word lines associated with one or more different pages of memory cells of the memory block, upon applying the first read voltage sensing whether a bit line of a memory cell in the selected page conducts, measuring a side effect associated with sensing whether the bit line of the memory cell in the selected page conducts, and assigning a LLR value to the memory cell as a soft LDPC input based at least in part on the measured side effect.
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