- 专利标题: BBUL material integration in-plane with embedded die for warpage control
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申请号: US13976356申请日: 2011-12-30
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公开(公告)号: US09601421B2公开(公告)日: 2017-03-21
- 发明人: Weng Hong Teh , Deepak V. Kulkarni
- 申请人: Weng Hong Teh , Deepak V. Kulkarni
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 国际申请: PCT/US2011/068045 WO 20111230
- 国际公布: WO2013/101161 WO 20130704
- 主分类号: H01L23/498
- IPC分类号: H01L23/498 ; H01L23/00 ; H05K3/46 ; H05K3/00
摘要:
An apparatus including a die including a first side and an opposite second side including a device side with contact points and lateral sidewalls defining a thickness of the die; a primary core adjacent at least a pair of the lateral sidewalls of the die; and a build-up carrier coupled to the second side of the die, the build-up carrier including a plurality of alternating layers of conductive material and insulating material, wherein at least one of the layers of conductive material is coupled to one of the contact points of the die. A method of forming a package and an apparatus including a computing device including a package are also disclosed.
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