Invention Grant
- Patent Title: Measurement system
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Application No.: US14825304Application Date: 2015-08-13
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Publication No.: US09605998B2Publication Date: 2017-03-28
- Inventor: Katsuya Nozawa
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2014-178878 20140903; JP2015-146870 20150724
- Main IPC: G01J1/04
- IPC: G01J1/04 ; G01S17/32 ; G01S17/10 ; G01S17/36 ; G01S17/89 ; G01S17/93 ; G01S7/48 ; G01S7/487 ; G01S7/493 ; G01S7/499 ; G01S7/491 ; G02F1/35

Abstract:
A measurement system, comprising: a first light source that generates first light and irradiates an object with the first light, at least one of an intensity, a polarization state, and a wavelength being modulated with a first period in the first light; a second light source that generates second light, at least one of an intensity, a polarization state, and a wavelength being modulated with a second period in the second light; a first optical system that mixes light from the object based on the first light with the second light; a nonlinear optical crystal that generates third light from the mixed light by sum-frequency generation phenomenon, the third light having a frequency equivalent to a sum of a frequency of the light from the object based on the first light and a frequency of the second light; and a photodetector that measures an intensity of the third light.
Public/Granted literature
- US20160061655A1 MEASUREMENT SYSTEM Public/Granted day:2016-03-03
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