Invention Grant
- Patent Title: Laser metrology system and method
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Application No.: US14156789Application Date: 2014-01-16
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Publication No.: US09606235B2Publication Date: 2017-03-28
- Inventor: Jonathan M. Saint Clair , Mitchell D. Voth , William D. Sherman , David C. Soreide
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Walters & Wasylyna LLC
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01S17/66 ; G01C11/00 ; G01B9/02 ; G01B11/24

Abstract:
A laser metrology system may include a modulated measurement beam, a beam splitter for splitting the measurement beam into a local oscillator beam and a transmitted beam, an optical assembly for projecting the transmitted beam to a measured area on a surface of a target structure and for receiving a reflected beam from the measured area, a beam combiner for combining the reflected beam and the local oscillator beam into a detection beam, a detector for processing the detection beam, the detector including a micro-lens for projecting the detection beam, a photodetector for carrying out coherent detection of the detection beam and detector electronics in communication with the photodetector for generating informational data from the detection beam, and a range processor for computing dimensional data about the measured area from the informational data.
Public/Granted literature
- US20150198433A1 Laser Metrology System and Method Public/Granted day:2015-07-16
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