Invention Grant
- Patent Title: Apparatus and method for measuring altitude of terminal
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Application No.: US14140314Application Date: 2013-12-24
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Publication No.: US09618337B2Publication Date: 2017-04-11
- Inventor: Jae-Woong Chun , Jeong-Min Park , Do-Hyoung Chung
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2012-0152994 20121226
- Main IPC: G01C5/06
- IPC: G01C5/06 ; G01C5/00 ; H04M1/00 ; G01L11/00 ; G01L7/00 ; H04B7/185

Abstract:
An apparatus and a method for measuring an altitude of a terminal which can correct an altitude error according to temporal and spatial changes are provided. The apparatus includes an atmospheric pressure measuring unit for measuring an atmospheric pressure from a barometer included in the terminal, a position determiner for measuring position information of the terminal, and a controller for, when a reference atmospheric pressure reception period is not generated, predicting a current reference atmospheric pressure by using previously received reference atmospheric pressures and measuring a current altitude by using the predicted reference atmospheric pressure and the measured atmospheric pressure.
Public/Granted literature
- US20140174175A1 APPARATUS AND METHOD FOR MEASURING ALTITUDE OF TERMINAL Public/Granted day:2014-06-26
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