Invention Grant
- Patent Title: Controlling dimensions of nanowires
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Application No.: US13752868Application Date: 2013-01-29
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Publication No.: US09631291B2Publication Date: 2017-04-25
- Inventor: Graeme Scott , Kevin Dooley , Lorraine Byrne , Pat J. Reilly
- Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: Fabian Vancott
- Main IPC: C25D1/04
- IPC: C25D1/04 ; C25D1/00 ; B82Y40/00

Abstract:
Controlling dimensions of nanowires includes lithographically forming a trench in a layer of a polymer resin with a width less than one micrometer where the polymer resin has a thickness less than one micrometer and is deposited over an electrically conductive substrate, depositing a nanowire material within the trench to form a nanowire, and obtaining the nanowire from the trench with a removal mechanism.
Public/Granted literature
- US20140209469A1 Controlling Dimensions of Nanowires Public/Granted day:2014-07-31
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