发明授权
- 专利标题: Charged particle beam system and method of operating a charged particle beam system
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申请号: US14969352申请日: 2015-12-15
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公开(公告)号: US09640364B2公开(公告)日: 2017-05-02
- 发明人: John A. Notte, IV , FHM-Faridur Rahman , Weijie Huang , Shawn McVey
- 申请人: Carl Zeiss Microscopy, LLC
- 申请人地址: US NY Thornwood
- 专利权人: Carl Zeiss Microscopy, LLC
- 当前专利权人: Carl Zeiss Microscopy, LLC
- 当前专利权人地址: US NY Thornwood
- 代理机构: Fish & Richardson P.C.
- 主分类号: H01J37/08
- IPC分类号: H01J37/08 ; H01J37/18 ; H01J27/26
摘要:
The present disclosure relates to a gas field ion source comprising a housing, an electrically conductive tip arranged within the housing, a gas supply for supplying one or more gases to the housing, wherein the one or more gases comprise neon or a noble gas with atoms having a mass larger than neon, and an extractor electrode having a hole to permit ions generated in the neighborhood of the tip to pass through the hole. A surface of the extractor electrode facing the tip can be made of a material having a negative secondary ion sputter rate of less than 10−5 per incident neon ion.
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