Invention Grant
- Patent Title: Integrated FinFET structure having a contact plug pitch larger than fin and first metal pitch
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Application No.: US14800697Application Date: 2015-07-16
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Publication No.: US09653346B2Publication Date: 2017-05-16
- Inventor: Shih-Chin Lin , Kuei-Chun Hung , Jerry Che Jen Hu , Ming-Jui Chen , Chen-Hsien Hsu
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Priority: TW104118850A 20150611
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L23/528 ; H01L21/768 ; H01L29/78 ; H01L23/535

Abstract:
An integrated circuits structure includes a semiconductor substrate, at least an non-planar field effect transistor (FET) device formed on the semiconductor substrate, and an interconnection structure formed on the semiconductor substrate. The non-planar FET device includes a plurality of fins and a gate electrode. The interconnection structure includes a plurality of first group metals and a plurality of second group metals. The first group metals are formed on the non-planar FET and the second group metals are formed on the first group metals. The first group metals include a first metal pitch and the second group metals include a second metal pitch. The second metal pitch is 1.2-1.5 times to the first metal pitch.
Public/Granted literature
- US20160329241A1 INTEGRATED CIRCUIT STRUCTURE AND METHOD FOR FORMING THE SAME Public/Granted day:2016-11-10
Information query
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