Invention Grant
- Patent Title: Method of forming semiconductor device
-
Application No.: US15185007Application Date: 2016-06-16
-
Publication No.: US09666491B1Publication Date: 2017-05-30
- Inventor: Zhibiao Zhou , Ding-Lung Chen
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/768 ; H01L23/00 ; H01L21/8256 ; H01L23/528 ; H01L27/088 ; H01L29/66 ; H01L49/02 ; H01L21/477 ; H01L21/428 ; H01L29/40

Abstract:
A method of forming a semiconductor device includes following steps. Firstly, a first transistor is formed on a first surface of a substrate. Next, a thinning process is performed on the second surface of the substrate which is opposite to the first surface, to form a third surface. Then, a second transistor is formed on the third surface, in which the second transistor and the first transistor are electrically connected to each other through a through-silicon via penetrating through the first surface and the third surface.
Information query
IPC分类: