Invention Grant
- Patent Title: Capacitor combination stress testing
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Application No.: US14474012Application Date: 2014-08-29
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Publication No.: US09678132B2Publication Date: 2017-06-13
- Inventor: Andrew Marshall , Ping Jiang
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R27/26 ; G01R31/00

Abstract:
A method of evaluating at least one parameter of a first capacitor. The method couples a number of capacitors in a capacitor network to a common node, the number of capacitors comprising at least three capacitors. Further, the method first applies a first voltage range to the capacitor network for causing a first voltage drop across the first capacitor, and it evaluates the at least one parameter in response to the first voltage range. The method second applies a second voltage range to the capacitor network for causing a second voltage drop across the first capacitor, the second voltage drop greater than the first voltage drop, and it evaluates the at least one parameter in response to the second voltage range.
Public/Granted literature
- US20160061877A1 CAPACITOR COMBINATION STRESS TESTING Public/Granted day:2016-03-03
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