Invention Grant
- Patent Title: Method and apparatus for measuring ultraviolet light exposure
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Application No.: US14878264Application Date: 2015-10-08
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Publication No.: US09689741B2Publication Date: 2017-06-27
- Inventor: Kihun Eom , Dohyoung Chung , Kihong Min , Jeongmin Park
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Cha & Reiter, LLC.
- Priority: KR10-2014-0140667 20141017
- Main IPC: G01J1/42
- IPC: G01J1/42 ; G01J1/02
Abstract:
An electronic device comprising: an ultraviolet (UV) light sensor; and a processor configured to: generate a plurality of initial UV light measurements by using the UV light sensor, wherein each of the plurality of initial UV light measurements is associated with a respective orientation of the electronic device; and select a reference UV light measurement from the plurality.
Public/Granted literature
- US20160109289A1 METHOD AND APPARATUS FOR MEASURING ULTRAVIOLET LIGHT EXPOSURE Public/Granted day:2016-04-21
Information query
