Invention Grant
- Patent Title: Leakage testing of integrated circuits using a logarithmic transducer and a voltmeter
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Application No.: US14645541Application Date: 2015-03-12
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Publication No.: US09696376B2Publication Date: 2017-07-04
- Inventor: Ricardo Pablo Mikalo
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Amerson Law Firm, PLLC
- Main IPC: G01R31/30
- IPC: G01R31/30 ; G01R31/28 ; G01R31/02
Abstract:
A test configuration for testing a leakage current of a device under test (DUT) of an integrated circuit is provided including a logarithmic transducer electrically connected to the DUT and a voltmeter electrically connected to the logarithmic transducer.
Public/Granted literature
- US20160266200A1 LEAKAGE TESTING OF INTEGRATED CIRCUITS Public/Granted day:2016-09-15
Information query
