Invention Grant
- Patent Title: Threshold voltage margin analysis
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Application No.: US14681618Application Date: 2015-04-08
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Publication No.: US09728278B2Publication Date: 2017-08-08
- Inventor: Kishore K. Muchherla , Sampath K. Ratnam , Abolfazl Rashwand
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/50 ; G11C29/52 ; G11C5/14 ; G11C16/34 ; G11C29/42 ; G06F11/10

Abstract:
The present disclosure is related to a threshold voltage margin analysis. An example embodiment apparatus can include a memory and a controller coupled to the memory. The controller is configured to determine a previous power loss of a memory to be an asynchronous power loss, and identify a portion of the memory last subject to programming operations during the determined asynchronous power loss. The controller is further configured to perform a threshold voltage (Vt) margin analysis on the portion of the memory responsive to the determined asynchronous power loss.
Public/Granted literature
- US20160118143A1 THRESHOLD VOLTAGE MARGIN ANALYSIS Public/Granted day:2016-04-28
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