- Patent Title: Tunneling field effect transistors with a variable bandgap channel
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Application No.: US15122402Application Date: 2014-03-28
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Publication No.: US09741832B2Publication Date: 2017-08-22
- Inventor: Uygar Avci , Dmitri Nikonov , Ian Young
- Applicant: INTEL CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Grossman, Tucker, Perreault & Pfleger, PLLC
- International Application: PCT/US2014/032117 WO 20140328
- International Announcement: WO2015/147849 WO 20151001
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/739 ; H01L29/10 ; H01L29/08 ; H01L29/24 ; H01L29/786 ; H01L49/00 ; H01L29/423

Abstract:
Tunneling field effect transistors (TFETs) including a variable bandgap channel are described. In some embodiments, one or more bandgap characteristics of the variable bandgap channel may be dynamically altered by at least one of the application or withdrawal of a force, such as a voltage or electric field. In some embodiments the variable bandgap channel may be configured to modulate from an ON to an OFF state and vice versa in response to the application and/or withdrawal of a force. The variable bandgap channel may exhibit a bandgap that is smaller in the ON state than in the OFF state. As a result, the TFETs may exhibit one or more of relatively high on current, relatively low off current, and sub-threshold swing below 60 mV/decade.
Public/Granted literature
- US20170069738A1 TUNNELING FIELD EFFECT TRANSISTORS WITH A VARIABLE BANDGAP CHANNEL Public/Granted day:2017-03-09
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