- 专利标题: Collecting diagnostic data from chips
-
申请号: US15139499申请日: 2016-04-27
-
公开(公告)号: US09746516B2公开(公告)日: 2017-08-29
- 发明人: Steven M. Douskey , Ryan A. Fitch , William V. Huott , Mary P. Kusko
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理商 Scott S. Dobson
- 主分类号: G01R31/3177
- IPC分类号: G01R31/3177 ; G01R31/28 ; G01R31/3185 ; G01R31/317
摘要:
A failing latch is identified on a chip including a plurality of latches with the failing latch receiving data propagated from a first set of test input latches. A diagnostic set of latches is determined which includes the failing latch and a set of related latches. The set of related latches each receives data propagated from at least one test input latch from the first set of test input latches. The set of related latches is identified from a related latches table. One or more tests are performed on the chip and test output data is collected from the diagnostic set of latches. The related latches table is created by tracing from a target latch.
公开/授权文献
- US20160238656A1 COLLECTING DIAGNOSTIC DATA FROM CHIPS 公开/授权日:2016-08-18
信息查询