Invention Grant
- Patent Title: Apparatuses, devices and methods for sensing a snapback event in a circuit
-
Application No.: US15177919Application Date: 2016-06-09
-
Publication No.: US09747981B2Publication Date: 2017-08-29
- Inventor: Jeremy Hirst , Hernan Castro , Stephen Tang
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C13/00 ; G11C7/06 ; G11C7/12

Abstract:
Example subject matter disclosed herein relates to apparatuses and/or devices, and/or various methods for use therein, in which an application of an electric potential to a circuit may be initiated and subsequently changed in response to a determination that a snapback event has occurred in a circuit. For example, a circuit may comprise a memory cell that may experience a snapback event as a result of an applied electric potential. In certain example implementations, a sense circuit may be provided which is responsive to a snapback event occurring in a memory cell to generate a feed back signal to initiate a change in an electric potential applied to the memory cell.
Public/Granted literature
- US20160365141A1 APPARATUSES, DEVICES AND METHODS FOR SENSING A SNAPBACK EVENT IN A CIRCUIT Public/Granted day:2016-12-15
Information query