- 专利标题: Nitride semiconductor substrate having recesses at interface between base substrate and initial nitride
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申请号: US15202736申请日: 2016-07-06
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公开(公告)号: US09748344B2公开(公告)日: 2017-08-29
- 发明人: Noriko Omori , Hiroshi Oishi , Yoshihisa Abe , Jun Komiyama , Kenichi Eriguchi , Tomoko Watanabe
- 申请人: CoorsTek KK
- 申请人地址: JP Tokyo
- 专利权人: COORSTEK KK
- 当前专利权人: COORSTEK KK
- 当前专利权人地址: JP Tokyo
- 代理机构: Buchahan Ingersoll & Rooney PC
- 优先权: JP2015-136598 20150708; JP2016-105768 20160527
- 主分类号: H01L29/20
- IPC分类号: H01L29/20 ; H01L29/34 ; H01L21/02 ; H01L29/06
摘要:
The present invention provides a nitride semiconductor substrate having an initial nitride and a nitride semiconductor sequentially stacked on one principal plane of a base substrate, wherein the nitride semiconductor substrate comprises recesses depressed from an interface between the base substrate and the initial nitride toward the base substrate along one arbitrary cross section; the recesses each have a diameter of 6 nm or more and 60 nm or less and are formed at a density of 3×108 pieces/cm2 or more and 1×1011 pieces/cm2 or less; and the recess preferably has a depth of 3 nm or more and 45 nm or less from the interface between the base substrate and the initial nitride toward the base substrate.
公开/授权文献
- US20170011919A1 NITRIDE SEMICONDUCTOR SUBSTRATE 公开/授权日:2017-01-12
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