Invention Grant
- Patent Title: X-ray inspection device
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Application No.: US15502491Application Date: 2015-08-05
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Publication No.: US09752996B2Publication Date: 2017-09-05
- Inventor: Kazuyuki Sugimoto , Osamu Hirose
- Applicant: ISHIDA CO., LTD.
- Applicant Address: JP Kyoto
- Assignee: ISHIDA CO., LTD.
- Current Assignee: ISHIDA CO., LTD.
- Current Assignee Address: JP Kyoto
- Agency: Shinjyu Global IP
- Priority: JP2014-163968 20140811
- International Application: PCT/JP2015/072182 WO 20150805
- International Announcement: WO2016/024502 WO 20160218
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01N23/18 ; G01N23/04

Abstract:
Provided is a highly reliable X-ray inspection device having two line sensors, in which accurate inspection results can be obtained even when there is displacement of the mounting position of the line sensors. The X-ray inspection device is provided with a conveyor unit for conveying an article, an X-ray emitter, a first line sensor, a second line sensor, a detection unit, and a corrected-image generation unit. The X-ray emitter emits X-rays to the article conveyed by the conveyor unit. The first line sensor detects, in a low energy band, X-rays that have passed through the article. The second line sensor detects, in a high energy band, X-rays that have passed through the article. The detection unit detects positional displacement of the second line sensor with respect to the first line sensor in horizontal direction and vertical direction.
Public/Granted literature
- US20170227477A1 X-RAY INSPECTION DEVICE Public/Granted day:2017-08-10
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