Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
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Application No.: US15242489Application Date: 2016-08-20
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Publication No.: US09754949B2Publication Date: 2017-09-05
- Inventor: Satoshi Kodama , Eiji Hasegawa
- Applicant: Renesas Electronics Corporation
- Applicant Address: JP Tokyo
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Tokyo
- Agency: Shapiro, Gabor and Rosenberger, PLLC
- Priority: JP2015-164789 20150824
- Main IPC: H01L27/115
- IPC: H01L27/115 ; H01L27/11521 ; H01L29/423

Abstract:
An insulating film made of the same material as that of a gate insulating film is formed so as to cover one sidewall of a control gate on a conducting film for floating gate. By selectively removing the conducting film for floating gate with the insulating film as a mask, a floating gate is formed from the conducting film for floating gate, and a portion of the gate insulating film is exposed at the floating gate. A nitrogen introduced portion is formed by introducing nitrogen into the exposed portion of the gate insulating film. Then, the insulating film is removed to expose an upper surface of a lateral protrusion of the floating gate. An erase gate is formed so as to face the upper surface and a side surface of the lateral protrusion.
Public/Granted literature
- US20170062446A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2017-03-02
Information query
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