Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
-
Application No.: US14953632Application Date: 2015-11-30
-
Publication No.: US09761733B2Publication Date: 2017-09-12
- Inventor: Shunpei Yamazaki , Haruyuki Baba , Akio Suzuki , Hiromi Sawai , Masahiko Hayakawa , Noritaka Ishihara , Masashi Oota
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2014-242856 20141201; JP2015-047546 20150310; JP2015-118401 20150611; JP2015-126832 20150624
- Main IPC: H01L29/10
- IPC: H01L29/10 ; H01L29/786 ; H01L29/24 ; H01L29/04 ; H01L29/66 ; H01L21/02 ; H01L21/203

Abstract:
After a sputtering gas is supplied to a deposition chamber, plasma including an ion of the sputtering gas is generated in the vicinity of a target. The ion of the sputtering gas is accelerated and collides with the target, so that flat-plate particles and atoms of the target are separated from the target. The flat-plate particles are deposited with a gap therebetween so that the flat plane faces a substrate. The atom and the aggregate of the atoms separated from the target enter the gap between the deposited flat-plate particles and grow in the plane direction of the substrate to fill the gap. A film is formed over the substrate. After the deposition, heat treatment is performed at high temperature in an oxygen atmosphere, which forms an oxide with a few oxygen vacancies and high crystallinity.
Public/Granted literature
- US20160155852A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2016-06-02
Information query
IPC分类: