Invention Grant
- Patent Title: System and method for measuring doppler effect utilizing elastic and inelastic light scattering
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Application No.: US14537683Application Date: 2014-11-10
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Publication No.: US09766262B2Publication Date: 2017-09-19
- Inventor: Duane D. Smith
- Applicant: RAYTHEON COMPANY
- Applicant Address: US MA Waltham
- Assignee: RAYTHEON COMPANY
- Current Assignee: RAYTHEON COMPANY
- Current Assignee Address: US MA Waltham
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: G01P5/26
- IPC: G01P5/26 ; G01S17/58 ; G01S17/95

Abstract:
Method and apparatus for measuring a Doppler effect of a scattered light include: projecting an ultra violet (UV) light towards a target by a light emitter; receiving the UV light scatter from the target from the emitted UV light reflected from the target by a light receiver; measuring the frequency shift of the UV light scatter with respect to the emitted UV light to obtain distribution of line of sight velocity of macroscopic matters of the target corresponds to a Doppler shift; processing the distribution of the line of sight velocity to determine the Doppler effect of the UV light scatter; and separating the wind line of sight velocity as the centroid shift of the microscopic Doppler shift probability distribution.
Public/Granted literature
- US20160131676A1 SYSTEM AND METHOD FOR MEASURING DOPPLER EFFECT UTILIZING ELASTIC AND INELASTIC LIGHT SCATTERING Public/Granted day:2016-05-12
Information query
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