Methods of forming features

Invention Grant

US09767989B2 Methods of forming features 有权

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Patent Title: Methods of forming features
Application No.: US14938026

Application Date: 2015-11-11
Publication No.: US09767989B2

Publication Date: 2017-09-19
Inventor: Sridhar Dubbaka , Sriram Viswanathan , Christina Hutchinson
Applicant: SEAGATE TECHNOLOGY LLC
Applicant Address: US CA Cupertino
Assignee: Seagate Technology LLC
Current Assignee: Seagate Technology LLC
Current Assignee Address: US CA Cupertino
Agency: Mueting, Raasch & Gebhardt, P.A.
Main IPC: H01L21/312
IPC: H01L21/312 ; B44C1/22 ; H01J37/32 ; G11B5/31 ; G11B5/00

Abstract:

A method of forming a feature in a void, the method including filling the void having at least one sloped wall with a polymeric material; forming a layer of photoresist over the polymeric material; forming a gap in the layer of photoresist; and etching the polymeric material exposed by the gap in the layer of photoresist to form a feature.

Public/Granted literature

US20160133440A1 METHODS OF FORMING FEATURES Public/Granted day:2016-05-12

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L21/00	专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/02	.半导体器件或其部件的制造或处理
H01L21/04	..至少具有一个跃变势垒或表面势垒的器件，例如PN结、耗尽层、载体集结层
H01L21/18	...器件有由周期表Ⅳ族元素或含有/不含有杂质的AⅢBⅤ族化合物构成的半导体，如掺杂材料
H01L21/30	....用H01L21/20至H01L21/26各组不包含的方法或设备处理半导体材料的（在半导体材料上制作电极的入H01L21/28）
H01L21/31	.....在半导体材料上形成绝缘层的，例如用于掩膜的或应用光刻技术的（密封层入H01L21/56）；以及这些层的后处理；这些层的材料的选择
H01L21/312	......有机层，例如光刻胶（H01L21/3105、H01L21/32优先）