Invention Grant
- Patent Title: Light measuring apparatus employing optical electric field enhancing device
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Application No.: US14668500Application Date: 2015-03-25
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Publication No.: US09791375B2Publication Date: 2017-10-17
- Inventor: Shogo Yamazoe , Masayuki Naya , Megumi Shiota
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2012-215406 20120928
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01N21/00 ; G01N21/65 ; G01B11/14 ; G01J3/02

Abstract:
Using an optical electric field enhancing device including a fine uneven structure made of gold formed on the front surface of a transparent substrate, illumination light of a wavelength in the range from 400 to 530 nm is applied at least to an analyte, positional information of the analyte is detected by a position detection unit disposed on the rear surface side of the optical electric field enhancing device, and excitation light is applied to the detected position by an excitation light application unit. Signal light emitted from the analyte when the excitation light is applied is detected from the rear surface side of the transparent substrate.
Public/Granted literature
- US20150198535A1 LIGHT MEASURING APPARATUS EMPLOYING OPTICAL ELECTRIC FIELD ENHANCING DEVICE Public/Granted day:2015-07-16
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