Invention Grant
- Patent Title: Mitigation of single event latchup
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Application No.: US15382385Application Date: 2016-12-16
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Publication No.: US09793899B1Publication Date: 2017-10-17
- Inventor: Pierre Maillard , Jue Arver , Michael J. Hart , John K. Jennings
- Applicant: Xilinx, Inc.
- Applicant Address: US CA San Jose
- Assignee: XILINX, INC.
- Current Assignee: XILINX, INC.
- Current Assignee Address: US CA San Jose
- Agent LeRoy D. Maunu
- Main IPC: H03K19/003
- IPC: H03K19/003 ; H03K19/177

Abstract:
The disclosed IC includes a load circuit and a temperature sensor circuit. The temperature sensor circuit measures temperature of the IC and stores temperature data in a register. An SEL mitigation circuit monitors the IC for a temperature change indicative of an SEL. A temperature change greater than a threshold over a time interval is indicative of an SEL. The SEL mitigation circuit is configured to reduce voltage applied to the IC to a voltage level that clears an SEL in the IC in response to a temperature change exceeding the threshold and to increase voltage applied to the load circuit after the reduction in voltage.
Information query