公开(公告)号：US09793899B1

公开(公告)日：2017-10-17

申请号：US15382385

申请日：2016-12-16

Applicant: Xilinx, Inc.

Inventor： Pierre Maillard ,  Jue Arver ,  Michael J. Hart ,  John K. Jennings

IPC: H03K19/003 ,  H03K19/177

CPC classification number: H03K19/17764 ,  H03K19/0033

Abstract: The disclosed IC includes a load circuit and a temperature sensor circuit. The temperature sensor circuit measures temperature of the IC and stores temperature data in a register. An SEL mitigation circuit monitors the IC for a temperature change indicative of an SEL. A temperature change greater than a threshold over a time interval is indicative of an SEL. The SEL mitigation circuit is configured to reduce voltage applied to the IC to a voltage level that clears an SEL in the IC in response to a temperature change exceeding the threshold and to increase voltage applied to the load circuit after the reduction in voltage.