Invention Grant
- Patent Title: Method for evaluating Fresnel diffraction border profiles
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Application No.: US14441420Application Date: 2013-10-09
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Publication No.: US09797712B2Publication Date: 2017-10-24
- Inventor: Werner Blohm , Harald Sikora
- Applicant: Sikora AG
- Applicant Address: DE Bremen
- Assignee: Sikora AG
- Current Assignee: Sikora AG
- Current Assignee Address: DE Bremen
- Agency: Young Basile Hanlon & MacFarlane, P.C.
- Priority: DE102012021892 20121108
- International Application: PCT/EP2013/071016 WO 20131009
- International Announcement: WO2014/072144 WO 20140515
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01B11/02 ; G01B11/10

Abstract:
A method for determining the position of at least one edge of an object, in particular a strand, comprises illuminating the object using light from at least one coherent light source, wherein diffraction borders are generated on both geometric boundaries of the shadow caused by the object. The method also includes recording the spatial intensity profile of at least one diffraction border using at least one single or multi line optical sensor, differentiating the at least one recorded intensity profile with respect to location and plotting it using a squared location axis, and comparing the at least one recorded intensity profile, differentiated with respect to location and plotted using a squared location axis, to at least one periodic reference intensity profile. The position of at least one edge of the object is determined on the basis of the completed comparison.
Public/Granted literature
- US20150268034A1 METHOD FOR EVALUATING FRESNEL DIFFRACTION BORDER PROFILES Public/Granted day:2015-09-24
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