A circuit for implementing a scan chain in an integrated circuit having a clock domain crossing is described. The circuit comprises a first dual-edge storage circuit configured to receive an input signal at a scan input and to receive a first clock signal in a first clock domain at a clock input; a storage element having a data input configured to receive an output of the first dual-edge storage circuit; a second dual-edge storage circuit configured to receive an output of the storage element at a scan input and to receive a second clock signal in a second clock domain at a clock input; and a pulse generator configured to provide, to a clock input of the storage element, a pulse signal having a pulse width selected to enable the second dual-edge storage element to store the output of the first dual-edge storage element.