- 专利标题: Sample analyzer and method for replacing light source unit
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申请号: US14836222申请日: 2015-08-26
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公开(公告)号: US09810621B2公开(公告)日: 2017-11-07
- 发明人: Hiroyuki Matsuura
- 申请人: Sysmex Corporation
- 申请人地址: JP
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 当前专利权人地址: JP
- 代理机构: Brinks Gilson & Lione
- 优先权: JP2014-172508 20140827
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01N21/01 ; G01N35/04 ; G01N35/00
摘要:
Disclosed is a sample analyzer including: a transport apparatus configured to transport a sample rack holding a sample container; and a measurement apparatus body configured to measure a sample in the sample container held in the sample rack transported by the transport apparatus, wherein the transport apparatus includes a light source holding unit configured to detachably hold a light source unit, and the measurement apparatus body includes a detection unit configured to detect, via an analysis specimen containing the sample, light emitted from the light source unit held in the light source holding unit.
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