Invention Grant
- Patent Title: Nonvolatile memory device, memory system, method of operating nonvolatile memory device, and method of operating memory system
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Application No.: US15281837Application Date: 2016-09-30
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Publication No.: US09852804B2Publication Date: 2017-12-26
- Inventor: Jong-Chul Park , Hyun-Young Yoo , Sang-Soo Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2015-0172662 20151204
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/04 ; G11C16/34 ; G11C16/10 ; G11C16/26 ; G11C29/02

Abstract:
A method of operating a nonvolatile memory device that includes a three-dimensional (3D) memory cell array is provided as follows. A first read operation is performed on first memory cells connected to a first word line by using a first read voltage level. A read retry operation is, if the first read operation fails, performed on the first memory cells so that a read retry voltage level is set to a second read voltage level. A read offset table is determined based on a difference between the first read voltage level and the second read voltage level. The read offset table stores a plurality of read voltage offsets. A second read operation is performed on second memory cells connected to a second word line by using a third read voltage level determined using the read offset table.
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