Device for optically scanning and measuring an environment
摘要:
A device for optically scanning and measuring an environment is provided. The device includes at least one projector for producing at least one uncoded pattern on an object in the environment. A first camera is provided for recording at least one first image of the object provided with the pattern, the first camera having a first image plane. A second camera is provided for recording at least one second image of the object provided with the uncoded pattern, the second camera being spaced apart from the first camera in order to acquire the uncoded pattern on a second image plane. A controller is provided having a processor configured to determine the three-dimensional coordinates of points on the surface of the object based at least in part on the uncoded pattern, the at least one first image and the at least one second image.
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