Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US15113288Application Date: 2015-01-14
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Publication No.: US09869686B2Publication Date: 2018-01-16
- Inventor: Takamichi Mori , Hitoshi Tokieda
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2014-012069 20140127
- International Application: PCT/JP2015/050706 WO 20150114
- International Announcement: WO2015/111470 WO 20150730
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N35/02

Abstract:
With the increase in the speed of operation of a device, it is necessary to perform washing to drying for a wide range of a probe in a short time. A probe, a washing nozzle which ejects a washing liquid, a vacuum nozzle which sucks air, a washing tank, which is connected to the washing nozzle and the vacuum nozzle, and in which washing and drying of the probe is performed by ejecting the washing liquid from the washing nozzle and then sucking air by the vacuum nozzle, a waste liquid flow path, which is connected to the washing tank, and into which the washing liquid is discharged, and a shielding member 100 which shields a flow path between the washing tank and the waste liquid flow path after the washing liquid is ejected from the washing nozzle.
Public/Granted literature
- US20170010293A1 AUTOMATIC ANALYZER Public/Granted day:2017-01-12
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