Invention Grant
- Patent Title: Optical mirror, X-ray fluorescence analysis device, and method for X-ray fluorescence analysis
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Application No.: US14761493Application Date: 2014-02-27
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Publication No.: US09880329B2Publication Date: 2018-01-30
- Inventor: Volker Rossiger
- Applicant: Helmut Fischer GmbH Insitut fur Elektronik und Messtechnik
- Agency: Renner, Otto, Boisselle & Sklar, LLP
- Priority: DE102013102270 20130307
- International Application: PCT/EP2014/053799 WO 20140227
- International Announcement: WO2014/135429 WO 20140912
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G02B5/08 ; G01B15/02 ; G01N23/22

Abstract:
An x-ray fluorescence analysis device, including an x-ray source for irradiating a sample with x-ray radiation, an x-ray detector for measuring x-ray fluorescence radiation emitted by the sample, and a camera for producing an optical control image of the irradiated measurement point of a sample by means of an optical mirror arranged at an angle in the beam path of the x-ray source, which optical mirror includes a carrier having a mirror layer provided on the carrier. In order to create an x-ray florescence device by means of which realistic control recordings of the sample to be analyzed, in particular of the sampled surface point, the optical mirror has a passage window for the x-ray radiation, which is formed by an opening in the carrier and a foil forming the mirror layer and covering the opening on an outer surface of the carrier.
Public/Granted literature
- US20150362639A1 OPTICAL MIRROR, X-RAY FLUORESCENCE ANALYSIS DEVICE, AND METHOD FOR X-RAY FLUORESCENCE ANALYSIS Public/Granted day:2015-12-17
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