Invention Grant
- Patent Title: Analog-to-digital converter with offset calibration
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Application No.: US15293740Application Date: 2016-10-14
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Publication No.: US09882575B1Publication Date: 2018-01-30
- Inventor: Hongxing Li , Michael C. W. Coln , Michael Mueck
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H03M1/06
- IPC: H03M1/06 ; H03M1/10 ; H03M1/12 ; H03M1/38

Abstract:
An analog-to-digital converter (ADC) circuit including error correction circuitry for correcting offset drifts in an ADC, such as a successive approximation register (SAR) ADC. The offset drifts can be reduced, such as by sampling the offset following an analog-to-digital conversion and subsequently providing an error correction signal based on the sampled offset.
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