Invention Grant
- Patent Title: Method and apparatus for detecting defect in transparent body
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Application No.: US15472870Application Date: 2017-03-29
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Publication No.: US09885673B2Publication Date: 2018-02-06
- Inventor: Shinji Fukuda
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kawasaki-shi
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kawasaki-shi
- Agency: Oliff PLC
- Priority: JP2016-088568 20160426
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/958 ; G01N21/88

Abstract:
A quantitative, high-sensitivity examination of defects in a transparent product is realized, using a low-cost and space-saving optical dimension measuring apparatus to carry out measurement in a non-contact manner to avoid damaging the object of inspection and to avoid sensory examination. A transparent body to be examined is disposed between a light emitting unit and a light-receiving unit arranged opposite each other. A change in an optical path caused by a defect in the transparent body is detected based on a change in a light ray emitted from the light emitting unit and being incident on the light-receiving unit after passing through the transparent body and a light-blocking object disposed between the transparent body and the light-receiving unit.
Public/Granted literature
- US20170307546A1 METHOD AND APPARATUS FOR DETECTING DEFECT IN TRANSPARENT BODY Public/Granted day:2017-10-26
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