- 专利标题: Lighting device for inspection and inspection system
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申请号: US15308001申请日: 2015-08-04
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公开(公告)号: US09891176B2公开(公告)日: 2018-02-13
- 发明人: Shigeki Masumura
- 申请人: MACHINE VISION LIGHTING INC.
- 申请人地址: JP Tokyo
- 专利权人: Machine Vision Lighting Inc.
- 当前专利权人: Machine Vision Lighting Inc.
- 当前专利权人地址: JP Tokyo
- 代理机构: Dilworth & Barrese, LLP
- 优先权: JP2015-060049 20150323
- 国际申请: PCT/JP2015/072022 WO 20150804
- 国际公布: WO2016/151877 WO 20160929
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01N21/88 ; G02B27/30 ; G02B27/14 ; G02B27/02
摘要:
In the inspection lighting device, between a surface light source for emitting an inspection light and the inspection object, at least one shielding mask is disposed, and a lens is disposed on a side closer to the inspection object than the shielding mask such that the shielding mask is positioned across the focus position of this lens as a center. In an irradiation solid angle of the inspection light for the inspection object formed when the light emitted from the surface light source is irradiated on to the inspection object by the lens the shielding mask forms a dark area. So that, in accordance with a change in reflection, transmission, scattering occurring at a feature point on the inspection object, a shape, a size, a tilt of the irradiation solid angle of the inspection light can be changed.
公开/授权文献
- US20170067835A1 LIGHTING DEVICE FOR INSPECTION AND INSPECTION SYSTEM 公开/授权日:2017-03-09
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