- 专利标题: Structured illumination device and structured illumination microscope device
-
申请号: US14996717申请日: 2016-01-15
-
公开(公告)号: US09897790B2公开(公告)日: 2018-02-20
- 发明人: Hiroaki Nakayama , Yumiko Ouchi
- 申请人: NIKON CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: NIKON CORPORATION
- 当前专利权人: NIKON CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff PLC
- 优先权: JP2013-148730 20130717
- 主分类号: F21V9/16
- IPC分类号: F21V9/16 ; G02B21/06 ; G01N21/64 ; G02B21/00 ; G02B21/36 ; G02B27/58 ; G02B21/16
摘要:
A structured illumination device includes: a diffraction unit that diffracts light beams of a plurality of wavelengths that are emitted simultaneously or sequentially by a light source into a plurality of diffracted beams; and an optical system that forms interference fringes on a surface of a sample using the plurality of diffracted beams diffracted by the diffraction unit, the optical system including a first optical system and a second optical system that focuses the plurality of diffracted beams at positions on or near a pupil plane of the first optical system, and a magnification characteristic dY(λ) of the second optical system satisfying the condition of (fo·nw−afλ/P)≦dY(λ)≦(fo·NA−afλ/P), where a=1 (for M=1, 2) or a=2 (for M=3).
公开/授权文献
信息查询