Invention Grant
- Patent Title: Pupil plane calibration for scatterometry overlay measurement
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Application No.: US14244179Application Date: 2014-04-03
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Publication No.: US09909982B2Publication Date: 2018-03-06
- Inventor: Barak Bringoltz , Irina Vakshtein , Ofir Aharon , Guy Ben Dov , Zeev Bomzon
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: G01C19/00
- IPC: G01C19/00 ; G01N21/47 ; G03F7/20

Abstract:
Methods and calibrations modules are provided, for calibrating a pupil center in scatterometry overlay measurements. The calibration comprises calculating fluctuations from a first statistical figure of merit such as an average of an overlay signal per pixel at the pupil and significantly reducing, for example minimizing, the fluctuations with respect to a second statistical figure of merit thereof, such as a pupil weighted variance of the fluctuations.
Public/Granted literature
- US20140257734A1 PUPIL PLANE CALIBRATION FOR SCATTEROMETRY OVERLAY MEASUREMENT Public/Granted day:2014-09-11
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